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Criticism is Welcome

I got an unusual request from Dario Clocchiatti, a fresh graduate from Università degli Studi di Udine, Italy. After reading critical responses on many theses posted in this blog, Dario would like to present his MS degree thesis for a review. The thesis work has been done over a period of six months in CMOSIS, under Guy Meynants supervision.

The thesis "Characterization of Single Pixels in CMOS Image Sensors" is available for download at Google Drive. It covers a wide range of information, starting from various pixel operation aspects, all the way to the electrical measurements (optical characterization is not covered) and even PPD device simulations. Some figures from the thesis:

Criticism is Welcome Criticism is Welcome Reviewed by MCH on September 10, 2014 Rating: 5

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