Advantest introduces what it claims to be the industry's fastest image-capture module to cost-efficiently test image sensors with D-PHY and M-PHY interfaces. The new T2000 3Gbps CMOS Image Capture Module operates on its T2000 ISS system:
The T2000 3Gbps CMOS Image Capture Module simultaneously tests up to 64 devices in parallel, significantly reducing test costs. In addition to improving yields by performing at-speed testing in production, the module also can be used to shorten turnaround time in verifying semiconductor designs on first silicon.
"Ongoing, rapid improvements in the performance and resolution of CMOS image sensors as well as the growing volume of electronic products depending upon them continue to exert downward pressure on production costs," said Satoru Nagumo, senior vice president of the ASD Test Business Group at Advantest Corporation. "Our newest generation of image-capturing technology enables our customers to lower the cost of test while meeting the performance requirements for advanced image sensors."
The T2000 3Gbps CMOS Image Capture Module simultaneously tests up to 64 devices in parallel, significantly reducing test costs. In addition to improving yields by performing at-speed testing in production, the module also can be used to shorten turnaround time in verifying semiconductor designs on first silicon.
"Ongoing, rapid improvements in the performance and resolution of CMOS image sensors as well as the growing volume of electronic products depending upon them continue to exert downward pressure on production costs," said Satoru Nagumo, senior vice president of the ASD Test Business Group at Advantest Corporation. "Our newest generation of image-capturing technology enables our customers to lower the cost of test while meeting the performance requirements for advanced image sensors."
Advantest Upgraded its CIS Tester Speed
Reviewed by MCH
on
November 29, 2012
Rating:
Reviewed by MCH
on
November 29, 2012
Rating:
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