PR Newswire: Israel-based Camtek announced that it received an order for multiple wafer inspection systems from one of the world's largest manufacturers of CMOS image sensors. Camtek's back-end inspection equipment will be used throughout the manufacturing process and will significantly contribute to improving the customer's yield. The order includes multiple Falcon systems for 2D inspection. The systems are expected to be installed during Q1 2011.
"Our systems provide a Sub-resolution Detection feature and provide coverage of a wide range of CIS process defects, including Color Filter Array (CFA) process control, and thus enable the most reliable detection of critical defects in the image sensor array at a significantly higher throughput. ... As cameras trend to using CMOS Image Sensors with bigger arrays and higher resolutions, more inspection is needed. For example, cameras with 3 megapixels are sample inspected while cameras of 5 megapixels or greater, tend to be 100% inspected. ... We are expecting additional multiple orders from this strategic customer during 2011," commented Roy Porat, Camtek's CEO.
"Our systems provide a Sub-resolution Detection feature and provide coverage of a wide range of CIS process defects, including Color Filter Array (CFA) process control, and thus enable the most reliable detection of critical defects in the image sensor array at a significantly higher throughput. ... As cameras trend to using CMOS Image Sensors with bigger arrays and higher resolutions, more inspection is needed. For example, cameras with 3 megapixels are sample inspected while cameras of 5 megapixels or greater, tend to be 100% inspected. ... We are expecting additional multiple orders from this strategic customer during 2011," commented Roy Porat, Camtek's CEO.
Camtek Announces Orders for its CIS Inspection System
![Camtek Announces Orders for its CIS Inspection System]()
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February 15, 2011
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