Trioptics Proposes Fast Test of WLCs

Photonics.com: Trioptics comes with a high-volume production test solution for wafer level camera (WLC) lens quality. The test is based on Shack-Hartmann measurement system analyzing the reflected light wavefront. It compares this waveform with a good reference one and marks bad lens across the wafer. Potentially this technique can be used also for wafer-scale lens positioning and focusing.