News from EI 2011 - Part 3

Albert Theuwissen continues to share his impressions from Electronic Imaging 2011 conference. The concluding part talks mainly about Toshiba paper “Dark noise in a CMOS imager pixel with negative bias on transfer gate”, by Hirofumi Yamashita et al. The negative bias is said to greatly reduce hot pixels, but increase number of warm pixels. The solution is not too surprising - reduce electric field between Tx gate and floating diffusion.